Signal Integrity IC test sockets use our the probes we design and manufacture. Our probes are designed using the highest quality materials, clad barrels, solid precious metal alloy plungers. We have fully characterized electrical and well applied mechanical simulations. Multiple choices for the proper springs and plunger types cover each device. With over 4000 combinations of probes and components, SII can ideally match the application to provide the longest probe lifetime and maximize test equipment utilization using our IC test sockets
We design and manufacture various High performance test sockets and hand lid jigs built from high quality engineering plastic: Torlon, Vespel, Ceramic Peek, Macro, Photoveel, Semitron, MDS100, and Ultem.
Our vertical probes can interface to BGA, QFN, QFP, LGA, CSP, SO, WLCSP package configurations
Our probes and sockets are designed to perform best for high frequency, and high power applications. We can build sockets and die probe fixtures to 0.2 mm pitch and have a catalog of pins to meet almost any IC test application.
0.4 mm Kelvin Contact Socket 25 Gb/s , 300 Watt SOC device